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Experimental demonstration of TM lateral leakage in a standard SOI photonics platform

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dc.contributor.authorHope, A.P.
dc.contributor.authorNguygen, T.
dc.contributor.authorBogaerts, Wim
dc.contributor.authorMitchell, A.
dc.contributor.imecauthorBogaerts, Wim
dc.contributor.orcidimecBogaerts, Wim::0000-0003-1112-8950
dc.date.accessioned2021-10-22T02:03:37Z
dc.date.available2021-10-22T02:03:37Z
dc.date.embargo9999-12-31
dc.date.issued2014
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/23952
dc.source.beginpage77
dc.source.conference11th International Conference on Group IV Photonics - GFP
dc.source.conferencedate27/08/2014
dc.source.conferencelocationParis France
dc.source.endpage78
dc.title

Experimental demonstration of TM lateral leakage in a standard SOI photonics platform

dc.typeProceedings paper
dspace.entity.typePublication
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