Publication:

Guest editors' introduction: Robust 3-D stacked ICs

Date

2016-05

Journal article

Simple item page Full metadata Statistics

Author(s)

Khursheed, Saqib

;

;

;

Marinissen, Erik Jan

Journal

IEEE Design & Test

Statistics

1866 since deposited on 2021-10-23

Acq. date: 2026-03-17