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SRAM enablement beyond N7: a BTI study

Date

2017
Proceedings Paper
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dc.contributor.authorGupta, Mohit
dc.contributor.authorWeckx, Pieter
dc.contributor.authorCosemans, Stefan
dc.contributor.authorSchuddinck, Pieter
dc.contributor.authorBaert, Rogier
dc.contributor.authorJang, Doyoung
dc.contributor.authorSherazi, Yasser
dc.contributor.authorRaghavan, Praveen
dc.contributor.authorKaczer, Ben
dc.contributor.authorSpessot, Alessio
dc.contributor.authorMocuta, Anda
dc.contributor.authorDehaene, Wim
dc.contributor.imecauthorGupta, Mohit
dc.contributor.imecauthorWeckx, Pieter
dc.contributor.imecauthorCosemans, Stefan
dc.contributor.imecauthorSchuddinck, Pieter
dc.contributor.imecauthorBaert, Rogier
dc.contributor.imecauthorJang, Doyoung
dc.contributor.imecauthorSherazi, Yasser
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorSpessot, Alessio
dc.contributor.imecauthorDehaene, Wim
dc.contributor.orcidimecGupta, Mohit::0000-0002-1924-1264
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.date.accessioned2021-10-24T05:18:39Z
dc.date.available2021-10-24T05:18:39Z
dc.date.embargo9999-12-31
dc.date.issued2017
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/28437
dc.identifier.urlhttp://ieeexplore.ieee.org/document/7936353/
dc.source.beginpageCR-4.1
dc.source.conferenceIEEE International Reliability Physics Sysmposium - IRPS
dc.source.conferencedate2/04/2017
dc.source.conferencelocationMonterey, CA USA
dc.source.endpageCR-4.6
dc.title

SRAM enablement beyond N7: a BTI study

dc.typeProceedings paper
dspace.entity.typePublication
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