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Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
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Post-Ionization of Silicon Clusters in Atom Probe Microscopy: A Joint Theoretical and Experimental Investigation.
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Date
2019
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Cuduvally, Ramya
;
Oosterbos, Giel
;
Morris, Richard
;
Fleischmann, Claudia
;
Ferrari, Piero
;
Scheerder, Jeroen
;
Vantomme, Andre
;
Vandervorst, Wilfried
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1965
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Views
1965
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-15
Citations