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Experimental thermal characterisation of electronic components by means of the submerged double jet impingement (SDJI) method

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dc.contributor.authorChristiaens, Filip
dc.contributor.authorBeyne, Eric
dc.contributor.authorVandevelde, Bart
dc.contributor.authorRoggen, Jean
dc.contributor.authorMertens, Robert
dc.contributor.authorTemmerman, W.
dc.contributor.authorNelemans, W.
dc.contributor.authorLauwers, E.
dc.contributor.authorAllaert, K.
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorVandevelde, Bart
dc.contributor.imecauthorMertens, Robert
dc.date.accessioned2021-09-30T08:00:06Z
dc.date.available2021-09-30T08:00:06Z
dc.date.embargo9999-12-31
dc.date.issued1997
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/1768
dc.source.beginpage254
dc.source.conferenceInternational Systems Packaging Symposium - ISPS
dc.source.conferencedate2/12/1997
dc.source.conferencelocationSan Diego, CA USA
dc.source.endpage259
dc.title

Experimental thermal characterisation of electronic components by means of the submerged double jet impingement (SDJI) method

dc.typeProceedings paper
dspace.entity.typePublication
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