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Variability sources in nanoscale bulk FinFETs and TiTaN- a promising low variability WFM for 7/5nm CMOS nodes
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Variability sources in nanoscale bulk FinFETs and TiTaN- a promising low variability WFM for 7/5nm CMOS nodes
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Date
2019
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bhoir, Mandar S.
;
Chiarella, Thomas
;
Ragnarsson, Lars-Ake
;
Mitard, Jerome
;
Horiguchi, Naoto
;
Mohapatra, Nihar R.
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since deposited on 2021-10-27
Acq. date: 2025-12-15
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since deposited on 2021-10-27
Acq. date: 2025-12-15
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Downloads
1
since deposited on 2021-10-27
Acq. date: 2025-12-15
Views
1909
since deposited on 2021-10-27
Acq. date: 2025-12-15
Citations