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Temperature influence on the analog performance of 45° rotated triple-gate nFinFETs
Publication:
Temperature influence on the analog performance of 45° rotated triple-gate nFinFETs
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Pavanello, M.A.
;
de Souza, M.
;
Martino, J.A.
;
Simoen, Eddy
;
Claeys, Cor
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Downloads
1
since deposited on 2021-10-19
Acq. date: 2025-12-10
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1848
since deposited on 2021-10-19
1
last month
Acq. date: 2025-12-10
Citations