A comparison of extraction techniques for threshold voltage mismatch

dc.contributor.author	Croon, Jeroen
dc.contributor.author	Tuinhout, Hans
dc.contributor.author	Difrenza, R.
dc.contributor.author	Knol, J.
dc.contributor.author	Moonen, A.J.
dc.contributor.author	Decoutere, Stefaan
dc.contributor.author	Maes, Herman
dc.contributor.author	Sansen, Willy
dc.contributor.imecauthor	Decoutere, Stefaan
dc.contributor.orcidimec	Decoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned	2021-10-14T21:18:28Z
dc.date.available	2021-10-14T21:18:28Z
dc.date.issued	2002
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/6158
dc.source.beginpage	235
dc.source.conference	International Conference on Microelectronic Test Structures
dc.source.conferencedate	8/04/2002
dc.source.conferencelocation	Cork Ireland
dc.source.endpage	240
dc.title	A comparison of extraction techniques for threshold voltage mismatch
dc.type	Proceedings paper
dspace.entity.type	Publication
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