Publication:
Next to FinFET, how will ESD suffer?
Date
| dc.contributor.author | Chen, Shih-Hung | |
| dc.contributor.imecauthor | Chen, Shih-Hung | |
| dc.date.accessioned | 2021-10-31T08:12:46Z | |
| dc.date.available | 2021-10-31T08:12:46Z | |
| dc.date.issued | 2021 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36565 | |
| dc.identifier.url | https://incompliancemag.com/article/next-to-finfet-how-will-esd-suffer/ | |
| dc.source.issue | July | |
| dc.source.journal | In Compliance Magazine | |
| dc.title | Next to FinFET, how will ESD suffer? | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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