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Extreme scaling of low-k dielectric for sub 45 nm BEOL roadmaps
Publication:
Extreme scaling of low-k dielectric for sub 45 nm BEOL roadmaps
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Date
2009
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Verdonck, Patrick
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1852
since deposited on 2021-10-18
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Acq. date: 2025-12-16
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Metrics
Views
1852
since deposited on 2021-10-18
1
last month
Acq. date: 2025-12-16
Citations