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Comparative experimental analysis of time-dependent variability using a transistor test array
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Comparative experimental analysis of time-dependent variability using a transistor test array
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Date
2016
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simicic, Marko
;
Subirats, Alexandre
;
Weckx, Pieter
;
Kaczer, Ben
;
Franco, Jacopo
;
Roussel, Philippe
;
Linten, Dimitri
;
Thean, Aaron
;
Groeseneken, Guido
;
Gielen, Georges
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1887
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Acq. date: 2025-12-10
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Metrics
Views
1887
since deposited on 2021-10-23
2
last month
Acq. date: 2025-12-10
Citations