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Guided by Uncertainty: Adaptive Frequency Sampling Using Gaussian Processes

 
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cris.virtual.orcid0000-0002-9587-6923
cris.virtual.orcid0009-0005-6366-321X
cris.virtual.orcid0000-0001-6600-1792
cris.virtual.orcid0000-0003-2899-4636
cris.virtualsource.department0a9dec9b-6490-4505-b9c3-a259df58d053
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cris.virtualsource.departmente8043942-f5dc-4e9f-b5ef-85780b08f47a
cris.virtualsource.orcid0a9dec9b-6490-4505-b9c3-a259df58d053
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cris.virtualsource.orcid3d0467d5-8f2f-463b-9a89-cd2e89911f08
cris.virtualsource.orcide8043942-f5dc-4e9f-b5ef-85780b08f47a
dc.contributor.authorUllrick, Thijs
dc.contributor.authorLindemans, Yens
dc.contributor.authorDeschrijver, Dirk
dc.contributor.authorDhaene, Tom
dc.date.accessioned2026-08-24T13:26:07Z
dc.date.available2026-08-24T13:26:07Z
dc.date.createdwos2026
dc.date.issued2025
dc.description.abstractAdaptive frequency sampling (AFS) aims to reduce the number of computationally expensive electromagnetic (EM) simulations required for the accurate characterization of high-frequency components. This paper introduces a novel uncertainty-guided AFS scheme that employs a rational mixture kernel within a Gaussian Process (GP) model to capture frequency-dependent correlation structures in microwave Sparameters. By leveraging the probabilistic nature of GPs, an acquisition strategy is introduced to adaptively sample uncertain regions exhibiting high local variation. Integrated within the kernel-aided rational macromodeling (KARMA) framework, the proposed approach enables the construction of compact rational state-space models with enhanced accuracy and reduced simulation cost.
dc.description.wosFundingTextThis work was supported by the 'Flemish Research Foundation (FWO-Vlaanderen) under grant G031421N' and 'Onderzoeksprogramma Artificiele Intelligentie (AI) Vlaanderen' programs.
dc.identifier.doi10.1109/edaps66187.2025.11411736
dc.identifier.isbn979-8-3315-9660-6
dc.identifier.issn2151-1225
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/60094
dc.language.isoeng
dc.provenance.editstepusergreet.vanhoof@imec.be
dc.publisherIEEE
dc.source.conferenceIEEE Electrical Design of Advanced Packaging and Systems (EDAPS)
dc.source.conferencedate2025-12-15
dc.source.conferencelocationHokkaido
dc.source.journal2025 IEEE ELECTRICAL DESIGN OF ADVANCED PACKAGING AND SYSTEMS, EDAPS
dc.source.numberofpages4
dc.title

Guided by Uncertainty: Adaptive Frequency Sampling Using Gaussian Processes

dc.typeProceedings paper
dspace.entity.typePublication
imec.internal.crawledAt2026-07-14
imec.internal.sourcecrawler
imec.internal.wosCreatedAt2026-07-14
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