Publication:
Reliability of Porous Dielectrics
Date
| dc.contributor.author | Beyer, Gerald | |
| dc.contributor.author | Schaekers, Marc | |
| dc.contributor.imecauthor | Beyer, Gerald | |
| dc.contributor.imecauthor | Schaekers, Marc | |
| dc.contributor.orcidimec | Schaekers, Marc::0000-0002-1496-7816 | |
| dc.date.accessioned | 2021-10-16T00:46:07Z | |
| dc.date.available | 2021-10-16T00:46:07Z | |
| dc.date.issued | 2005 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10096 | |
| dc.source.conference | Semicon Europe | |
| dc.source.conferencedate | 12/04/2005 | |
| dc.source.conferencelocation | München Germany | |
| dc.title | Reliability of Porous Dielectrics | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |