Publication:
A 103-dB SFDR Calibration-Free Oversampled SAR ADC With Mismatch Error Shaping and Pre-Comparison Techniques
| dc.contributor.author | Shen, Yuting | |
| dc.contributor.author | Li, Hanyue | |
| dc.contributor.author | Xin, Haoming | |
| dc.contributor.author | Cantatore, Eugenio | |
| dc.contributor.author | Harpe, Pieter | |
| dc.contributor.imecauthor | Xin, Haoming | |
| dc.contributor.orcidext | Shen, Yuting::0000-0002-5379-2983 | |
| dc.contributor.orcidext | Li, Hanyue::0000-0002-7112-8154 | |
| dc.contributor.orcidext | Harpe, Pieter::0000-0002-6542-0001 | |
| dc.date.accessioned | 2023-08-01T15:17:44Z | |
| dc.date.available | 2023-06-20T10:35:04Z | |
| dc.date.available | 2023-08-01T15:17:44Z | |
| dc.date.embargo | 9999-12-31 | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This work was supported by the Dutch Research Council (NWO) under Grant 16594. | |
| dc.identifier.doi | 10.1109/JSSC.2021.3135559 | |
| dc.identifier.issn | 0018-9200 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41873 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 734 | |
| dc.source.endpage | 744 | |
| dc.source.issue | 3 | |
| dc.source.journal | IEEE JOURNAL OF SOLID-STATE CIRCUITS | |
| dc.source.numberofpages | 11 | |
| dc.source.volume | 57 | |
| dc.title | A 103-dB SFDR Calibration-Free Oversampled SAR ADC With Mismatch Error Shaping and Pre-Comparison Techniques | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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