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P-N junction peripheral current analysis using gated diode measurements
Publication:
P-N junction peripheral current analysis using gated diode measurements
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Date
1999
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Czerwinski, A.
;
Simoen, Eddy
;
Poyai, Amporn
;
Claeys, Cor
Journal
Abstract
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2078
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Acq. date: 2026-01-11
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Metrics
Views
2078
since deposited on 2021-10-06
7
last month
Acq. date: 2026-01-11
Citations