Publication:
Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes
Date
| dc.contributor.author | Simoen, Eddy | |
| dc.contributor.author | Claeys, C. | |
| dc.contributor.author | Ohyama, Hidenori | |
| dc.contributor.author | Takami, Y. | |
| dc.contributor.author | Sunaga, H. | |
| dc.contributor.imecauthor | Simoen, Eddy | |
| dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
| dc.date.accessioned | 2021-09-30T09:31:59Z | |
| dc.date.available | 2021-09-30T09:31:59Z | |
| dc.date.issued | 1997 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/2138 | |
| dc.source.conference | APSORC '97; OCtober 6-9 , 1997; Kunamoto, Japan. | |
| dc.source.conferencelocation | ||
| dc.title | Factors determining the damage coefficients and the low-frequency noise in MeV proton irradiated silicon diodes | |
| dc.type | Oral presentation | |
| dspace.entity.type | Publication | |
| Files | ||
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