Publication:

A study of oxide defects in III-V MOS devices using electrical and mathematical methods

Date

2016-10
Dissertation
Simple item page Full metadata Statistics
 
dc.contributor.authorVais, Abhitosh
dc.contributor.imecauthorVais, Abhitosh
dc.contributor.orcidimecVais, Abhitosh::0000-0002-0317-7720
dc.contributor.thesisadvisorDe Meyer, Kristin
dc.contributor.thesisadvisorCollaert, Nadine
dc.date.accessioned2021-10-23T15:48:08Z
dc.date.available2021-10-23T15:48:08Z
dc.date.embargo9999-12-31
dc.date.issued2016-10
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/27423
dc.title

A study of oxide defects in III-V MOS devices using electrical and mathematical methods

dc.typePHD thesis
dspace.entity.typePublication
Files

Original bundle

Name:
36842.pdf
Size:
7.99 MB
Format:
Adobe Portable Document Format
Download
Publication available in collections:
Dissertations