Comparison of the low-frequency noise of bulk triple-gate FinFETs with and without dynamic threshold operation

dc.contributor.author	Cano de Andrade, Gloria
dc.contributor.author	Martino, J.A.
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Claeys, Cor
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-19T12:42:10Z
dc.date.available	2021-10-19T12:42:10Z
dc.date.embargo	9999-12-31
dc.date.issued	2011
dc.identifier.issn	0741-3106
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/18640
dc.source.beginpage	1597
dc.source.endpage	1599
dc.source.issue	11
dc.source.journal	IEEE Electron Device Letters
dc.source.volume	32
dc.title	Comparison of the low-frequency noise of bulk triple-gate FinFETs with and without dynamic threshold operation
dc.type	Journal article
dspace.entity.type	Publication
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