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Analytical characterization of new high k dielectric stacks
Publication:
Analytical characterization of new high k dielectric stacks
Date
2000
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
De Witte, Hilde
;
Conard, Thierry
;
Bender, Hugo
;
Vandervorst, Wilfried
Journal
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1915
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1915
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations