Publication:
Failure mechanisms for semiconductor atom probe tips
Date
| dc.contributor.author | Koelling, Sebastian | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-17T08:02:01Z | |
| dc.date.available | 2021-10-17T08:02:01Z | |
| dc.date.issued | 2008 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/13959 | |
| dc.source.conference | 51st International Field Emission Symposium | |
| dc.source.conferencedate | 29/06/2008 | |
| dc.source.conferencelocation | Rouen France | |
| dc.title | Failure mechanisms for semiconductor atom probe tips | |
| dc.type | Meeting abstract | |
| dspace.entity.type | Publication | |
| Files | ||
| Publication available in collections: |