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Determination of critical characteristics of low-k films by ellipsometric porosimetry
Publication:
Determination of critical characteristics of low-k films by ellipsometric porosimetry
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Date
2002
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Baklanov, Mikhaïl
;
Moguilnikov, Konstantin
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1885
since deposited on 2021-10-14
Acq. date: 2025-12-12
Citations
Metrics
Views
1885
since deposited on 2021-10-14
Acq. date: 2025-12-12
Citations