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Articles
Scaling the Ge gate stack: Towards sub 1nm EOT
Publication:
Scaling the Ge gate stack: Towards sub 1nm EOT
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Date
2012
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Sioncke, Sonja
;
Lin, Dennis
;
Delabie, Annelies
;
Conard, Thierry
;
Struyf, Herbert
;
De Gendt, Stefan
;
Caymax, Matty
Journal
ECS Journal of Solid State Science and Technology
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Views
1837
since deposited on 2021-10-20
3
last month
1
last week
Acq. date: 2025-12-15
Citations