Publication:
Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks
| dc.contributor.author | Vici, Andrea | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Bastos, Joao | |
| dc.contributor.author | Roussel, Philippe | |
| dc.contributor.author | De Wolf, Ingrid | |
| dc.contributor.imecauthor | Vici, Andrea | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Bastos, Joao | |
| dc.contributor.imecauthor | Roussel, Philippe | |
| dc.contributor.imecauthor | De Wolf, Ingrid | |
| dc.contributor.orcidimec | Roussel, Philippe::0000-0002-0402-8225 | |
| dc.contributor.orcidimec | De Wolf, Ingrid::0000-0003-3822-5953 | |
| dc.contributor.orcidimec | Bastos, Joao::0000-0002-8877-9850 | |
| dc.date.accessioned | 2023-04-26T09:35:28Z | |
| dc.date.available | 2023-02-27T03:28:16Z | |
| dc.date.available | 2023-04-26T09:35:28Z | |
| dc.date.issued | 2022 | |
| dc.description.wosFundingText | This research was partially supported by CyberSecurity Research Flanders with reference number VR20192203. | |
| dc.identifier.doi | 10.1109/IRPS48227.2022.9764555 | |
| dc.identifier.eisbn | 978-1-6654-7950-9 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/41167 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 27-31, 2022 | |
| dc.source.conferencelocation | Dallas | |
| dc.source.journal | na | |
| dc.source.numberofpages | 5 | |
| dc.subject.keywords | TRAP GENERATION | |
| dc.subject.keywords | MODEL | |
| dc.title | Combining SILC and BD statistics for low-voltage lifetime projection in HK/MG stacks | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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