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Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits
Publication:
Impact of irradiations performed at liquid helium temperatures on the operation of 0.7 μm CMOS devices and read-out circuits
Date
2004
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Mercha, Abdelkarim
;
Creten, Ybe
;
Merken, Patrick
;
Putzeys, Jan
;
De Moor, Piet
;
Claeys, Cor
;
Mohammazadeh, H.
;
Nickson, R.
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1816
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations
Metrics
Views
1816
since deposited on 2021-10-15
Acq. date: 2025-10-23
Citations