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MILP-based optimization of 2-D block masks for timing-aware dummy segment removal in self-aligned multiple patterning layouts
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MILP-based optimization of 2-D block masks for timing-aware dummy segment removal in self-aligned multiple patterning layouts
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Date
2017
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Debacker, Peter
;
Han, Kwangsoo
;
Kahng, Andrew B.
;
Lee, Hyein
;
Raghavan, Praveen
;
Wang, Lutong
Journal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
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1818
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-10
Citations