Publication:
Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations
Date
| dc.contributor.author | Campera, A. | |
| dc.contributor.author | Iannaccone, G. | |
| dc.contributor.author | Crupi, F. | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.date.accessioned | 2021-10-16T00:52:10Z | |
| dc.date.available | 2021-10-16T00:52:10Z | |
| dc.date.issued | 2005-04 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/10173 | |
| dc.source.beginpage | 35 | |
| dc.source.conference | 6th European Conference on Ultimate Integration of Silicon - ULIS | |
| dc.source.conferencedate | 7/04/2005 | |
| dc.source.conferencelocation | Bologna Italy | |
| dc.source.endpage | 38 | |
| dc.title | Extraction of physical parameters of alternative high-k gate stacks through comparison between measurements and quantum simulations | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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