Publication:
Segmentation-Guided Coordinate Regression for Robust Landmark Detection on X-Rays: Application to Automated Assessment of Lower Limb Alignment
| cris.virtual.department | #PLACEHOLDER_PARENT_METADATA_VALUE# | |
| cris.virtual.orcid | 0000-0001-5714-3254 | |
| cris.virtualsource.department | e133c726-54e2-43d0-b225-6704605822fd | |
| cris.virtualsource.orcid | e133c726-54e2-43d0-b225-6704605822fd | |
| dc.contributor.author | Sanchez, Sebastian Amador | |
| dc.contributor.author | Van Overschelde, Philippe | |
| dc.contributor.author | Vandemeulebroucke, Jef | |
| dc.contributor.imecauthor | Sanchez, Sebastian Amador | |
| dc.contributor.imecauthor | Vandemeulebroucke, Jef | |
| dc.contributor.orcidimec | Vandemeulebroucke, Jef::0000-0001-5714-3254 | |
| dc.date.accessioned | 2024-05-10T18:24:57Z | |
| dc.date.available | 2024-05-10T18:24:57Z | |
| dc.date.issued | 2024 | |
| dc.description.wosFundingText | No Statement Available | |
| dc.identifier.doi | 10.1109/ACCESS.2024.3394895 | |
| dc.identifier.issn | 2169-3536 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/43917 | |
| dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | |
| dc.source.beginpage | 61484 | |
| dc.source.endpage | 61497 | |
| dc.source.journal | IEEE ACCESS | |
| dc.source.numberofpages | 14 | |
| dc.source.volume | 12 | |
| dc.title | Segmentation-Guided Coordinate Regression for Robust Landmark Detection on X-Rays: Application to Automated Assessment of Lower Limb Alignment | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | Original bundle
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| Publication available in collections: |