Correlation between current-voltage measurements and the barrier height  determined by XPS in Ge p-MOS capacitors

dc.contributor.author	Fadida, Sivan
dc.contributor.author	Palumbo, F
dc.contributor.author	Nyns, Laura
dc.contributor.author	Lin, Dennis
dc.contributor.author	Van Elshocht, Sven
dc.contributor.author	Caymax, Matty
dc.contributor.author	Eizenberg, Moshe
dc.contributor.imecauthor	Nyns, Laura
dc.contributor.imecauthor	Lin, Dennis
dc.contributor.imecauthor	Van Elshocht, Sven
dc.contributor.imecauthor	Caymax, Matty
dc.contributor.orcidimec	Nyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimec	Van Elshocht, Sven::0000-0002-6512-1909
dc.date.accessioned	2021-10-21T07:34:13Z
dc.date.available	2021-10-21T07:34:13Z
dc.date.issued	2013
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/22331
dc.identifier.url	http://www2.avs.org/symposium/avs60/pdfs/abstractbook.pdf
dc.source.beginpage	8
dc.source.conference	AVS 60th International Symposium & Exhibition
dc.source.conferencedate	27/10/2013
dc.source.conferencelocation	Long Beach, CA USA
dc.title	Correlation between current-voltage measurements and the barrier height determined by XPS in Ge p-MOS capacitors
dc.type	Meeting abstract
dspace.entity.type	Publication
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