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Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM
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Impact of processing and stack optimization on the reliability of perpendicular STT-MRAM
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Date
2017
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Beek, Simon
;
Martens, Koen
;
Roussel, Philippe
;
Couet, Sebastien
;
Souriau, Laurent
;
Swerts, Johan
;
Kim, Woojin
;
Rao, Siddharth
;
Mertens, Sofie
;
Lin, Tsann
;
Crotti, Davide
;
Degraeve, Robin
;
Bury, Erik
;
Linten, Dimitri
;
Kar, Gouri Sankar
;
Groeseneken, Guido
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1945
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-10
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Metrics
Views
1945
since deposited on 2021-10-24
1
last month
Acq. date: 2025-12-10
Citations