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Analog performance and its variability in sub-10 nm fin-width FinFETs: a detailed analysis
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Analog performance and its variability in sub-10 nm fin-width FinFETs: a detailed analysis
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Date
2019
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43371.pdf
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Bhoir, Mandar S.
;
Chiarella, Thomas
;
Ragnarsson, Lars-Ake
;
Mitard, Jerome
;
Terzieva, Valentina
;
Horiguchi, Naoto
;
Mohapatra, Nihar R.
Journal
IEEE Journal of the Electron Devices Society
Abstract
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Acq. date: 2025-12-16
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since deposited on 2021-10-27
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Acq. date: 2025-12-16
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Downloads
1
since deposited on 2021-10-27
Acq. date: 2025-12-16
Views
1942
since deposited on 2021-10-27
1
last month
Acq. date: 2025-12-16
Citations