Publication:
Correlation of single trapping and detrapping effects in drain and gate currents of nanoscaled nFETs and pFETs
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1850 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-17
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Views
1850 since deposited on 2021-10-20
1last month
Acq. date: 2025-12-17
Citations