Publication:
Correlation of single trapping and detrapping effects in drain and gate currents of nanoscaled nFETs and pFETs
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1858 since deposited on 2021-10-20
2last month
Acq. date: 2026-04-07
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Statistics
Views
1858 since deposited on 2021-10-20
2last month
Acq. date: 2026-04-07
Citations