Publication:

Active trap determination at the interface of Ge and In0.53Ga0.47As substrates with dielectric layers

Date

2011
Proceedings Paper
Simple item page Full metadata Statistics
 
dc.contributor.authorMolle, A.
dc.contributor.authorBaldovino, S.
dc.contributor.authorLamagna, L.
dc.contributor.authorSpiga, S.
dc.contributor.authorLamperti, A.
dc.contributor.authorFanciulli, M.
dc.contributor.authorTsoutsou, D.
dc.contributor.authorGolias, E.
dc.contributor.authordimoulas, A.
dc.contributor.authorBrammertz, Guy
dc.contributor.authorMerckling, Clement
dc.contributor.authorCaymax, Matty
dc.contributor.imecauthorBrammertz, Guy
dc.contributor.imecauthorMerckling, Clement
dc.contributor.imecauthorCaymax, Matty
dc.contributor.orcidimecBrammertz, Guy::0000-0003-1404-7339
dc.contributor.orcidimecMerckling, Clement::0000-0003-3084-2543
dc.date.accessioned2021-10-19T16:28:26Z
dc.date.available2021-10-19T16:28:26Z
dc.date.issued2011
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/19447
dc.source.beginpage203
dc.source.conferencePhysics and Technology of High-k Materials 9
dc.source.conferencedate9/10/2011
dc.source.conferencelocationBoston, MA USA
dc.source.endpage221
dc.title

Active trap determination at the interface of Ge and In0.53Ga0.47As substrates with dielectric layers

dc.typeProceedings paper
dspace.entity.typePublication
Files
Publication available in collections:
Conference contributions