Design, Fabrication and Evaluation of Diamond Tip Chips for Reverse Tip Sample Scanning Probe Microscope Applications

dc.contributor.author	Gim, Sugil
dc.contributor.author	Hantschel, Thomas
dc.contributor.author	Kim, Jin Hyeok
dc.contributor.imecauthor	Hantschel, Thomas
dc.contributor.orcidimec	Hantschel, Thomas::0000-0001-9476-4084
dc.date.accessioned	2024-09-09T11:44:36Z
dc.date.available	2024-04-05T18:17:45Z
dc.date.available	2024-09-09T11:44:36Z
dc.date.embargo	2024-02-27
dc.date.issued	2024
dc.description.wosFundingText	This research was supported by the MOTIE (Ministry of Trade, Industry, and Energy) in Korea, under the Fostering Global Talents for Innovative Growth Program (P0017312) supervised by the Korea Institute for Advancement of Technology (KIAT) .
dc.identifier.doi	10.3740/MRSK.2024.34.2.105
dc.identifier.issn	1225-0562
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/43778
dc.publisher	MATERIALS RESEARCH SOC KOREA
dc.source.beginpage	105
dc.source.endpage	110
dc.source.issue	2
dc.source.journal	KOREAN JOURNAL OF MATERIALS RESEARCH
dc.source.numberofpages	6
dc.source.volume	34
dc.title	Design, Fabrication and Evaluation of Diamond Tip Chips for Reverse Tip Sample Scanning Probe Microscope Applications
dc.type	Journal article
dspace.entity.type	Publication
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