Publication:
Statistical SRAM analysis for yield enhancement
Date
| dc.contributor.author | Zuber, Paul | |
| dc.contributor.author | Miranda Corbalan, Miguel | |
| dc.contributor.author | Dobrovolny, Petr | |
| dc.contributor.author | van der Zanden, Koen | |
| dc.contributor.author | Jung, Jong-Hoon | |
| dc.contributor.imecauthor | Zuber, Paul | |
| dc.contributor.imecauthor | Dobrovolny, Petr | |
| dc.contributor.orcidimec | Dobrovolny, Petr::0000-0002-1465-481X | |
| dc.date.accessioned | 2021-10-19T01:08:46Z | |
| dc.date.available | 2021-10-19T01:08:46Z | |
| dc.date.issued | 2010 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/18435 | |
| dc.source.beginpage | 57 | |
| dc.source.conference | Design, Automation and Test in Europe Conference - DATE | |
| dc.source.conferencedate | 8/03/2010 | |
| dc.source.conferencelocation | Dresden Germany | |
| dc.source.endpage | 62 | |
| dc.title | Statistical SRAM analysis for yield enhancement | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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