Publication:
The influence of a structurally induced current crowding on electromigration
Date
| dc.contributor.author | Wang, Hui | |
| dc.contributor.author | Bruynseraede, Christophe | |
| dc.contributor.author | Chiaradia, David | |
| dc.contributor.author | Maex, Karen | |
| dc.contributor.imecauthor | Maex, Karen | |
| dc.date.accessioned | 2021-10-15T17:49:14Z | |
| dc.date.available | 2021-10-15T17:49:14Z | |
| dc.date.issued | 2004 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/9900 | |
| dc.source.beginpage | 241 | |
| dc.source.endpage | 244 | |
| dc.source.issue | 1_4 | |
| dc.source.journal | Microelectronic Engineering | |
| dc.source.volume | 76 | |
| dc.title | The influence of a structurally induced current crowding on electromigration | |
| dc.type | Journal article | |
| dspace.entity.type | Publication | |
| Files | ||
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