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Evaluation of a New Measurement Set-up for the Accurate Characterisation of the Near-Field Radiated Emission of Printed Circuit Boards

Date

1994
Proceedings Paper
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dc.contributor.authorCriel, Steven
dc.contributor.authorMartens, Luc
dc.contributor.authorDe Zutter, Daniel
dc.contributor.imecauthorMartens, Luc
dc.contributor.imecauthorDe Zutter, Daniel
dc.date.accessioned2021-09-29T12:40:17Z
dc.date.available2021-09-29T12:40:17Z
dc.date.issued1994
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/91
dc.source.beginpage51
dc.source.conferenceProceedings of the IEEE 3rd Topical Meeting of Electrical Performance of Electronic Packaging
dc.source.conferencedate2/11/1994
dc.source.conferencelocationMonterey, CA USA
dc.source.endpage53
dc.title

Evaluation of a New Measurement Set-up for the Accurate Characterisation of the Near-Field Radiated Emission of Printed Circuit Boards

dc.typeProceedings paper
dspace.entity.typePublication
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