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Threshold voltage instability mechanisms in p-GaN gate AlGaN/GaN HEMTs
Publication:
Threshold voltage instability mechanisms in p-GaN gate AlGaN/GaN HEMTs
Date
2019
Proceedings Paper
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Stockman, Arno
;
Canato, Eleonora
;
Meneghini, Matteo
;
Meneghesso, Gaudenzio
;
Moens, Peter
;
Bakeroot, Benoit
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1921
since deposited on 2021-10-27
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Acq. date: 2025-10-25
Citations
Metrics
Views
1921
since deposited on 2021-10-27
441
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations