Publication:
Active laser characterization by scanning capacitance microscopy
Date
| dc.contributor.author | Xu, Mingwei | |
| dc.contributor.author | Duhayon, Natasja | |
| dc.contributor.author | Vandervorst, Wilfried | |
| dc.contributor.imecauthor | Duhayon, Natasja | |
| dc.contributor.imecauthor | Vandervorst, Wilfried | |
| dc.date.accessioned | 2021-10-15T00:05:13Z | |
| dc.date.available | 2021-10-15T00:05:13Z | |
| dc.date.issued | 2002 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/7068 | |
| dc.source.beginpage | 173 | |
| dc.source.conference | GaAs-MANTECH Conference. Digest of Papers | |
| dc.source.conferencedate | 8/04/2002 | |
| dc.source.conferencelocation | San Diego, CA USA | |
| dc.source.endpage | 175 | |
| dc.title | Active laser characterization by scanning capacitance microscopy | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
| Files | ||
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