Publication:

Impact of charge trapping on imprint and its recovery in HfO2 based FeFET

Date

2019
Proceedings Paper
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42830.pdf 2.03 MB

Author(s)

Higashi, Yusuke  
;
Ronchi, Nicolo  
;
Kaczer, Ben  
;
Banerjee, Kaustuv  
;
McMitchell, Sean  
;
O'Sullivan, Barry  
;
Clima, Sergiu  
;
Minj, Albert  
;
Celano, Umberto  
;
Di Piazza, Luca  
;
Suzuki, Masamichi  
;
Linten, Dimitri  
;
Van Houdt, Jan  

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2044 since deposited on 2021-10-27
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