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Conference contributions
Impact of charge trapping on imprint and its recovery in HfO2 based FeFET
Publication:
Impact of charge trapping on imprint and its recovery in HfO2 based FeFET
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Date
2019
Proceedings Paper
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42830.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Higashi, Yusuke
;
Ronchi, Nicolo
;
Kaczer, Ben
;
Banerjee, Kaustuv
;
McMitchell, Sean
;
O'Sullivan, Barry
;
Clima, Sergiu
;
Minj, Albert
;
Celano, Umberto
;
Di Piazza, Luca
;
Suzuki, Masamichi
;
Linten, Dimitri
;
Van Houdt, Jan
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Acq. date: 2025-12-15
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Views
2048
since deposited on 2021-10-27
1
last month
1
last week
Acq. date: 2025-12-15
Citations