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A new method to extract the silicon film thickness of enhancement mode fully depleted SOI nMOSFETs at 300K
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2019 since deposited on 2021-10-14
4last month
Acq. date: 2025-12-08
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Metrics
Views
2019 since deposited on 2021-10-14
4last month
Acq. date: 2025-12-08
Citations