Carrier lifetime spectrocopy for defect characterization in semiconductor materials and devices

dc.contributor.author	Gaubas, Eugenijus
dc.contributor.author	Simoen, Eddy
dc.contributor.author	Vanhellemont, Jan
dc.contributor.imecauthor	Simoen, Eddy
dc.contributor.orcidimec	Simoen, Eddy::0000-0002-5218-4046
dc.date.accessioned	2021-10-23T10:55:26Z
dc.date.available	2021-10-23T10:55:26Z
dc.date.embargo	9999-12-31
dc.date.issued	2016
dc.identifier.issn	2162-8769
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/26642
dc.identifier.url	http://jss.ecsdl.org/content/5/4/P3108.short
dc.source.beginpage	P3108
dc.source.endpage	P3137
dc.source.issue	4
dc.source.journal	ECS Journal of Solid State Science and Technology
dc.source.volume	5
dc.title	Carrier lifetime spectrocopy for defect characterization in semiconductor materials and devices
dc.type	Journal article
dspace.entity.type	Publication
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