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Stochastic limitations for EUV resist kinetics towards the 16nm node
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Stochastic limitations for EUV resist kinetics towards the 16nm node
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Date
2011
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vaglio Pret, Alessandro
;
Garidis, Kostas
;
Gronheid, Roel
;
Biafore, John
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1930
since deposited on 2021-10-19
Acq. date: 2025-12-11
Citations
Metrics
Views
1930
since deposited on 2021-10-19
Acq. date: 2025-12-11
Citations