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Conference contributions
Ar-cluster beam profiling of material modifications in ion implanted deep ultraviolet photoresist
Publication:
Ar-cluster beam profiling of material modifications in ion implanted deep ultraviolet photoresist
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Date
2011
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Conard, Thierry
;
Franquet, Alexis
;
Tsvetanova, Diana
;
Mouhib, Tarik
;
Vandervorst, Wilfried
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1950
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Acq. date: 2026-02-24
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Views
1950
since deposited on 2021-10-19
2
last month
1
last week
Acq. date: 2026-02-24
Citations