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Study of low frequency noise in vertical NW-tunnel FETs with different source compositions

Date

2015
Proceedings Paper
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dc.contributor.authorNeves, Felipe
dc.contributor.authorAgopian, Paula
dc.contributor.authorCretu, Bogdan
dc.contributor.authorVandooren, Anne
dc.contributor.authorRooyackers, Rita
dc.contributor.authorSimoen, Eddy
dc.contributor.authorThean, Aaron
dc.contributor.authorClaeys, Cor
dc.contributor.imecauthorVandooren, Anne
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorThean, Aaron
dc.contributor.orcidimecVandooren, Anne::0000-0002-2412-0176
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.date.accessioned2021-10-22T21:23:16Z
dc.date.available2021-10-22T21:23:16Z
dc.date.embargo9999-12-31
dc.date.issued2015
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/25692
dc.identifier.urlhttp://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=7063795
dc.source.beginpage149
dc.source.conferenceJoint International EUROSOI Workshop and International Conference on Ultimate Integration on Silicon - EUROSOI-ULIS
dc.source.conferencedate26/01/2015
dc.source.conferencelocationBologna Italy
dc.source.endpage152
dc.title

Study of low frequency noise in vertical NW-tunnel FETs with different source compositions

dc.typeProceedings paper
dspace.entity.typePublication
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