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Origin of the current discretization in deep reset states of an Al2O3/Cu-based conductive-bridging memory, and impact on state level and variability
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Origin of the current discretization in deep reset states of an Al2O3/Cu-based conductive-bridging memory, and impact on state level and variability
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Date
2014
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Belmonte, Attilio
;
Degraeve, Robin
;
Fantini, Andrea
;
Kim, W
;
Houssa, Michel
;
Jurczak, Gosia
;
Goux, Ludovic
Journal
Applied Physics Letters
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1809
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Acq. date: 2025-12-15
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Views
1809
since deposited on 2021-10-22
2
last month
2
last week
Acq. date: 2025-12-15
Citations