Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method

dc.contributor.author	Goux, Ludovic
dc.contributor.author	Hurkx, Fred
dc.contributor.author	Wang, Xin Peng
dc.contributor.author	Delhougne, Romain
dc.contributor.author	Attenborough, Karen
dc.contributor.author	Gravesteijn, Dirk
dc.contributor.author	Wouters, Dirk
dc.contributor.author	Perez Gonzalez, Jesus
dc.contributor.imecauthor	Goux, Ludovic
dc.contributor.imecauthor	Delhougne, Romain
dc.contributor.orcidimec	Goux, Ludovic::0000-0002-1276-2278
dc.date.accessioned	2021-10-18T16:40:09Z
dc.date.available	2021-10-18T16:40:09Z
dc.date.issued	2010
dc.identifier.uri	https://imec-publications.be/handle/20.500.12860/17175
dc.source.beginpage	33
dc.source.conference	IEEE International Memory Workshop - IMW
dc.source.conferencedate	16/05/2010
dc.source.conferencelocation	Seoul Korea
dc.source.endpage	36
dc.title	Extraction of the retention properties of a phase-change cell from temperature-ramp tests using a novel method
dc.type	Proceedings paper
dspace.entity.type	Publication
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