Publication:

Electrical characteristics of Ge/GeOx(N)/HfO2 gate stacks

Date

2005
Journal article
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dc.contributor.authorHoussa, Michel
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorDelabie, Annelies
dc.contributor.authorVan Elshocht, Sven
dc.contributor.authorAfanasiev, Valeri
dc.contributor.authorAutran, J.L.
dc.contributor.authorStesmans, Andre
dc.contributor.authorMeuris, Marc
dc.contributor.authorHeyns, Marc
dc.contributor.imecauthorHoussa, Michel
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorDelabie, Annelies
dc.contributor.imecauthorVan Elshocht, Sven
dc.contributor.imecauthorAfanasiev, Valeri
dc.contributor.imecauthorStesmans, Andre
dc.contributor.imecauthorMeuris, Marc
dc.contributor.imecauthorHeyns, Marc
dc.contributor.orcidimecHoussa, Michel::0000-0003-1844-3515
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecVan Elshocht, Sven::0000-0002-6512-1909
dc.contributor.orcidimecMeuris, Marc::0000-0002-9580-6810
dc.date.accessioned2021-10-16T02:11:13Z
dc.date.available2021-10-16T02:11:13Z
dc.date.issued2005
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/10615
dc.source.beginpage1902
dc.source.endpage1905
dc.source.issue21_23
dc.source.journalJournal of Non-Crystalline Solids
dc.source.volume351
dc.title

Electrical characteristics of Ge/GeOx(N)/HfO2 gate stacks

dc.typeJournal article
dspace.entity.typePublication
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