Publication:

Investigation of spatial and energetic trap distributions in 1 nm EOT SiO2/HfO2 by discharging-sweep mode amplitude charge pumping

Date

2011
Journal article
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Author(s)

Chung, Eun-Ae
;
Nam, Kab-Jin
;
Kim, Young-Pil
;
Min, Ji-Young
;
Cho, Moon Ju
;
Hong, Hyungseok
;
Han, Jeong
;
Lee, Jae-Duk
;
Shin, Yu-Gyun
;
Choi, Siyoung
;
Kim, Sangsig

Journal

Solid State Sciences

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1907 since deposited on 2021-10-19
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