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Complete extraction of defect bands responsible for instabilities in n and pFinFETs
Publication:
Complete extraction of defect bands responsible for instabilities in n and pFinFETs
Date
2016
Proceedings Paper
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33609.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Rzepa, Gerhard
;
Waltl, Michael
;
Goes, Wolfgang
;
Kaczer, Ben
;
Franco, Jacopo
;
Chiarella, Thomas
;
Horiguchi, Naoto
;
Grasser, Tibor
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1879
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations
Metrics
Views
1879
since deposited on 2021-10-23
Acq. date: 2025-10-23
Citations