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Conference contributions
Characterization of nanodevices by STEM tomography
Publication:
Characterization of nanodevices by STEM tomography
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Date
2011-11
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Richard, Olivier
;
Vandooren, Anne
;
Kar, Gouri Sankar
;
Van Marcke, Patricia
;
Bender, Hugo
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Abstract
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1846
since deposited on 2021-10-19
Acq. date: 2026-01-05
Citations
Metrics
Views
1846
since deposited on 2021-10-19
Acq. date: 2026-01-05
Citations